X-ray Crystallographic Center at University of Maryland currently operates 5 diffractometers located in 3 labs:

Chemical Crystallography

Materials Characterization

Advances Diffraction 

Chemical Crystallography lab performs single crystal structure determination using Bruker CCD systems:

Bruker Smart Apex2 diffractometer is equipped with:   

• MoKα sealed X-ray tube;
• The newest Apex2 CCD area detector for rapid data collection from crystals;
• Graphite monochromator and Mono cap collimator;
• Motorized detector to crystal distance from 4 to 15 cm;
• CryoStream 700 low temperature system working in 80 K - 400 K range;
• Integrated Apex3 software suit for integration and advanced data treatment.

Mounting Crystals:      

• The lab is equipped wide field Leica microscope for crystal selection and mounting which is visualized on wall-mounted TV screen;
• Glove box with microscope/TV system for handling air and humidity sensitive crystals;
• Mounting technique used: MiTeGen loops, glass fibers, capillaries, cactus needles, etc.
• Selection of various viscosity oils for handeling and monting crystal medium.

Materials Characterization lab employs powder diffraction using Bruker C2 Discover and D8 Advance  systems:

C2/D8 Discover diffractometer with Area detector:       

• CuKα sealed X-ray tube with graphite Göbbel mirror;
• Vantec 500 area detector for 2D diffraction and high quality patterns from small samples;
• Parallel beam geometry to probe small areas or irregular shaped sample;
• XYZ stage for selecting desired spots and combinatorial screening;
• Capillary spinner for better randomizing crystallite orientation and air sensitive samples;
• Video microscope with laser alignment for precise sample positioning;
• DHS 1200 Hot stage providing high temperature up to 1200°C under vacuum, Ar or N2.

D8 Advance diffractometer with LynxEye and SolX:       

• Choice of MoKα and CuKα radiation;
• 9 Position sample changer and scatterless sample holders;
• ICDD powder diffraction database and search/match software;
• EVA software for data treatment;
• Advanced TOPAS software for structure refinement.

Advance Diffraction lab includes Small Angle X-ray Scattering and Thin Film Reflectivity systems:

Xenocs Xeuss SAXS/WAXS/GISAXS small angle system:  

• 5 Meter system with CuKα sealed 30W tube high brightness micro-focus source;
• Parallel beam optics and scatterless slits with automatic alignment;
• Variable Sample-to-Detector distance from 10 to 250 cm;
• 300K Dectris Pilatus detector for small angle scattering with a minimum Q = 0.0045 Å-1;
• 100K Dectris Pilatus detector for wide angle scattering (up to about 45° 2q);
• Linkam stage controlling temperature from about -100 °C to 250 °C.

PANalytical XPert Pro MRD system for reflectivity (XRR):            

• Sealed CuKα sealed tube with parallel beam W-Si mirror;
• Cross slits for incident beam and extra long diffracted beam collimator;
• 4 Circle goniometer with XYZ motions;
• Magnetic stage and tape-free mounting T-holder for wafers;
• Attenuator for direct beam measurement.