X-ray Crystallographic Center at University of Maryland currently operates 5 diffractometers located in 3 labs:

Chemical Crystallography

Materials Characterization

Advances Diffraction 

Chemical Crystallography lab performs single crystal structure determination using Bruker CCD systems:

Bruker Smart Apex2 diffractometer is equipped with:   

• MoKα sealed X-ray tube;
• The newest Apex2 CCD area detector for rapid data collection from crystals;

• Graphite monochromator and Mono cap collimator;

• Motorized detector to crystal distance from 4 to 15 cm;

• CryoStream 700 low temperature system working in 80 K - 400 K range;

• Integrated Apex3 software suit for integration and advanced data treatment.

Mounting Crystals:      

• The lab is equipped wide field Leica microscope for crystal selection and mounting which is visualized on wall-mounted TV screen;

• Glove box with microscope/TV system for handling air and humidity sensitive crystals;

• Mounting technique used: MiTeGen loops, glass fibers, capillaries, cactus needles, etc.

• Selection of various viscosity oils for handeling and monting crystal medium.

Materials Characterization lab employs powder diffraction using Bruker C2 Discover and D8 Advance  systems:

C2/D8 Discover diffractometer with Area detector:       

• CuKα sealed X-ray tube with graphite Göbbel mirror;

• Vantec 500 area detector for 2D diffraction and high quality patterns from small samples;

• Parallel beam geometry to probe small areas or irregular shaped sample;

• XYZ stage for selecting desired spots and combinatorial screening;

• Capillary spinner for better randomizing crystallite orientation and air sensitive samples;

• Video microscope with laser alignment for precise sample positioning;

• DHS 1200 Hot stage providing high temperature up to 1200°C under vacuum, Ar or N2.

D8 Advance diffractometer with LynxEye and SolX:       

• Choice of MoKα and CuKα radiation;

• 9 Position sample changer and scatterless sample holders;

• ICDD powder diffraction database and search/match software;

• EVA software for data treatment;

• Advanced TOPAS software for structure refinement.

Advance Diffraction lab includes Small Angle X-ray Scattering and Thin Film Reflectivity systems:

Xenocs Xeuss SAXS/WAXS/GISAXS small angle system:  

• 5 Meter system with CuKα sealed 30W tube high brightness micro-focus source;

• Parallel beam optics and scatterless slits with automatic alignment;

• Variable Sample-to-Detector distance from 10 to 250 cm;

• 300K Dectris Pilatus detector for small angle scattering with a minimum Q = 0.0045 Å-1;

• 100K Dectris Pilatus detector for wide angle scattering (up to about 45° 2q);

• Linkam stage controlling temperature from about -100 °C to 250 °C.

PANalytical XPert Pro MRD system for reflectivity (XRR):            

• Sealed CuKα sealed tube with parallel beam W-Si mirror;

• Cross slits for incident beam and extra long diffracted beam collimator;

• 4 Circle goniometer with XYZ motions;

• Magnetic stage and tape-free mounting T-holder for wafers;

• Attenuator for direct beam measurement.