X-ray Crystallographic Center at University of Maryland currently operates 5 diffractometers located in 3 labs:

Chemical Crystallography

Materials Characterization

Advances Diffraction 


Chemical Crystallography lab performs single crystal structure determination using Bruker CCD systems:

Bruker Smart Apex2 diffractometer is equipped with:   

Bruker Smart Apex2 diffractometer

  • MoKα sealed X-ray tube;
  • The newest Apex2 CCD area detector for rapid data collection from crystals;

  • Graphite monochromator and Mono cap collimator;

  • Motorized detector to crystal distance from 4 to 15 cm;

  • CryoStream 700 low temperature system working in 80 K - 400 K range;

  • Integrated Apex3 software suit for integration and advanced data treatment.


Mounting Crystals:      

  • Mounting CrystalsThe lab is equipped wide field Leica microscope for crystal selection and mounting which is visualized on wall-mounted TV screen;

  • Glove box with microscope/TV system for handling air and humidity sensitive crystals;

  • Mounting technique used: MiTeGen loops, glass fibers, capillaries, cactus needles, etc.

  • Selection of various viscosity oils for handeling and monting crystal medium.


Materials Characterization lab employs powder diffraction using Bruker C2 Discover and D8 Advance  systems:

C2/D8 Discover diffractometer with Area detector:       

  • C2/D8 Discover diffractometerCuKα sealed X-ray tube with graphite Göbbel mirror;

  • Vantec 500 area detector for 2D diffraction and high quality patterns from small samples;

  • Parallel beam geometry to probe small areas or irregular shaped sample;

  • XYZ stage for selecting desired spots and combinatorial screening;

  • Capillary spinner for better randomizing crystallite orientation and air sensitive samples;

  • Video microscope with laser alignment for precise sample positioning;

  • DHS 1200 Hot stage providing high temperature up to 1200°C under vacuum, Ar or N2.


D8 Advance diffractometer with LynxEye and SolX:       

  • D8 Advance diffractometer with LynxEye and SolXChoice of MoKα and CuKα radiation;

  • 9 Position sample changer and scatterless sample holders;

  • ICDD powder diffraction database and search/match software;

  • EVA software for data treatment;

  • Advanced TOPAS software for structure refinement.


Advance Diffraction lab includes Small Angle X-ray Scattering and Thin Film Reflectivity systems:

Xenocs Xeuss SAXS/WAXS/GISAXS small angle system:  

  • Xenocs Xeuss SAXS/WAXS/GISAXS small angle system5 Meter system with CuKα sealed 30W tube high brightness micro-focus source;

  • Parallel beam optics and scatterless slits with automatic alignment;

  • Variable Sample-to-Detector distance from 10 to 250 cm;

  • 300K Dectris Pilatus detector for small angle scattering with a minimum Q = 0.0045 Å-1;

  • 100K Dectris Pilatus detector for wide angle scattering (up to about 45° 2q);

  • Linkam stage controlling temperature from about -100 °C to 250 °C.


PANalytical XPert Pro MRD system for reflectivity (XRR):            

  • PANalytical XPert Pro MRD system for reflectivity (XRR)Sealed CuKα sealed tube with parallel beam W-Si mirror;

  • Cross slits for incident beam and extra long diffracted beam collimator;

  • 4 Circle goniometer with XYZ motions;

  • Magnetic stage and tape-free mounting T-holder for wafers;

  • Attenuator for direct beam measurement.